Optics & Infrared Sensing
Long Wave Infrared Metrology
The development of active and passive components needed to make useful devices in the mid- and long-wave infrared require specialized optics that are not readily available from catalog sources. For instance, the wide fast axis divergence of QC Lasers requires custom designed aspheres for efficient light collection and collimation. Since, there are no commercially available LWIR metrology tools, PNNL has developed a metrology suite to measure the performance of custom LWIR optical components that include:
- Scanner to measure fast- and slow-axis emission profile of a QCL, providing input for custom lens design.
- LWIR Twyman-Green interferometer to measure transmitted wavefront aberrations at the operating waveglength range.
- Scanner to measure the fast- and slow-axis spot size, beam propagation metric (M2), and intrinsic laser astigmatism.